Exibition

This page provides information about the exhibition to
introduce our products and technologies.
We are looking forward to see you.

Exibition

JPCA Show 2017

We are pleased to inform you that we will be exhibiting JPCA Show held from June 7 (Wed) – 9 (Fri), 2017 at Tokyo Big Site. For this occasion, we will give demonstration of Open / Leak inspection equipment, STAR REC M6Ⅱ for MSAP ,FPC inspection equipment NRFEIS-3045X and mutual capacitance tester, NRFEIS-730 for TSP. Please visit our booth 7C-14.

Product Lineup

- PCB Test System for MSAP “STAR REC M6Ⅱ”
- Multi-faced FPC O/S inspection system “NRFEIS-3045X” (On-site Demonstration)
- High speed capacitance tester “R-730” (On-site Demonstration)
- Automatic peeling/ detaching system “NRDF/ NRCL/ NRCR Series”
- Optical Inspection System “RSH/ RWi Series”
- SiP test system “GATS-7755”
- Compact test system “GATS-6310”
- 25um Probe Fixture

Information

Period From June 7th (Wed) to 9th (Fri)
Venue Tokyo Big Sight
Booth 7C-14
Official site http://www.jpcashow.com/show2017/en/

Automotive Engineering Exposition 2017

We are pleased to inform that NIDEC-READ will be exhibiting at Automotive Engineering Exposition, held in Pacifico Yokohama Exhibition Hall, on 24th -26th May 2017. For this opportunity, we are going to introduce variety of data acquisition systems by DEWETRON GmbH. "All-in-One" models include a built-in display and multi-touch touch panel will be showed up. Furthermore flexible measurement system for local or distributed measurements, TRIONet is ready to be introduced. Please visit and talk to us freely on your testing requirements. We are looking forward to see you soon.

Product Lineup

・Data Logger product by DEWETRON
 - DEWE2 A4
 - TRIONet
 - Sensors  etc.

Information

Period From May 24 th (Wed) to 26th (Fri)
Venue Pacifico Yokohama Exhibition Hall
Booth No.63
Official site http://expo.jsae.or.jp/english/

KPCA Show 2017

We are pleased to inform that we will be participating at KPCA Show, held in Seoul, 25th-27th April 2017. On this occasion, we are going to give demonstration of NRFEIS-3045X and NRFEIS-5060C, which is applicable for Flexible Printed Circuit testing. Additionally, high accuracy fixtures and high-speed capacitance tester R-730 will be introduced in the show. Please visit us if you need any solution for testing.

Product Lineup

- Flexible Printed Circuit testing system “NRFEIS-3045X/5060C” series
- High spec fixtures
- High-speed capacitance tester “R-730” etc.

Information

Period From April 25th(Tue) to 27th (Thu), 2017
Venue KINTEX
Booth F-G 301
Official site http://www.kpcashow.com/eng/main.asp

Semicon Southeast Asia 2017

We are pleased to inform that we will be participating at Semicon Southeast Asia 2017, held in Penang, 25th-27th April 2017. On this occasion, Nidec-Read will suggest world’s finest diameter, “MEMS spring probe” available for highly sophisticated test pitch. Additionally, if you are looking for AOI equipment, we are glad to provide our best test solution for you. Our flagship model, “RWi-series” which is available for fully integrated simultaneous 2D/3D & high-speed scanning is also introduced.

We are looking forward to see you soon.

Product Lineup

- Optical wafer bump inspection system “RWi-300” series
- MEMS spring probe
- Micro tube (Product by Luzcom) etc.

Information

Period From April 25 (Tue) to 27 (Thu), 2017
Venue SPICE Arena
Booth #905
Official site http://www.semiconsea.org/

27th FINETECH JAPAN

We are pleased to inform that we will be participating at FINETECH JAPAN, held in Tokyo, 5 th-7th April.
On this occasion, we will give a demonstration of OPEN/μShort/LEAK test systems NRFEIS-3045X for multifaceted FPC and NRFEIS-730 for singulated touch panel. Besides of that, we will introduce our wide variety of test solutions for you. We are looking forward to see you at our booth.

Product Lineup

- Touch Panel Inspection System NRFEIS-730
- FPC Test System NRFEIS-3045X etc

Information

Period From April 4 (Wed) to 7 (Fri),2017
Venue Tokyo Big Sight
Booth 37-9
Official site http://www.ftj.jp/en/Home/

CPCA Show 2017

We are pleased to inform that we will be participating at CPCA show 2017, held in Shanghai, 7th-9th March 2017. On this occasion, we will give you demonstration of touch panel inspection system and high speed tester for embedded substrate. The world’s finest diameter, MEMS spring probe capable of 60μm pitch will be introduced besides high end fixtures. We are looking forward to see you.

Product Lineup

- Touch Panel Inspection System NRFEIS-730
- High Speed Tester for Embedded Substrate R-5910i
- MEMS Spring Probe
- Variety of high-end fixture etc.

Information

Period From March 7 (Tue) to 9 (Thu), 2017
Venue Shanghai New International Expo Center
Booth 7K99
Official site http://www.ying-zhan.com/index.asp

Japan IT Week Osaka

We are pleased to inform you that we will be exhibiting in Japan IT Week Osaka held from 15 (Wed) – 17 (Fri) February 2017 at INTEX Osaka. For this occasion, we would like to introduce our Biometrics/Access control Iris recognition module. Our module for housing enables you to lock and unlock the door with no-key, empty hand. There is another series for access control especially suited for manufacturing line at factory and so on. We are more than happy to provide adequate equipment and looking forward to work with you soon.

Product Lineup

Iris recognition module
- for housing doors
- for user access control for manufacturing line
- for safe
- for immigration inspection (Product from Iristech)

Information

Period From February 15th (Wed) to 17th (Fri)
Venue INTEX Osaka
Booth 7-3
Official site http://www.japan-it.jp/en/kansai/

9th Int’l Automotive Electronics Technology Expo

We are pleased to inform that we will be participating at 9th Int‘l Automotive Electronics Technology Expo, held in Tokyo, 18th-20th January 2017. On this occasion, we would like to introduce our automotive testing & measurement system such as “DEWE2-A4”, “TRIONet” products by DEWETRON and the new “Embedded Package” ideal for camera module and other automotive devices.
You will be able to experience in an on-site demonstration how the equipment is effective. we are looking forward to seeing you at our booth.

Product Lineup

- Measurement systems by DEWETRON “DEWE2A4”, “TRIONet”
- “Embedded Package” for automotive devices such as camera module
- Broad range of testing tools for automotive devices

Information

Period From January 18 (Wed) to 20 (Fri), 2017
Venue Tokyo Big Sight East Hall
Booth E42-28
Official site http://www.car-ele.jp/en/Home/

SEMICON JAPAN 2016

We are pleased to inform you that we will be exhibiting in SEMICON JAPAN 2016 held from 14 (Wed) – 16 (Fri) December 2016 at Tokyo Big Sight. The exhibits this time will be variety of test solution for semiconductor manufacturing. Accordingly, we will introduce super fine MEMS spring probes improved in heat-resistance and available for high frequency substrate test. In the meantime, we will provide leading optical test system “RWi / RSH series” capable for 2D/3D inspection of PCB/Wafer.
We are looking forward to you visiting our booth at 1429.

Product Lineup

- Optical Inspection System “RWi / RSH series”
- MEMS Spring Probe “Heat-resistant type”, “Semiconductor package testing type”
- Micro tubes etc

Information

Period From December 14th (Wed) to 16th (Fri)
Venue Tokyo Big Sight
Booth 1429
Official site http://www.semiconjapan.org/en/

C-Touch & Display Shenzhen 2016

We are pleased to inform you that we will be exhibiting in C-Touch & Display Shenzhen 2016 held from 24 (Thu) – 26 (Sat) November 2016 at Shenzhen Convention & Exhibition Center. Our new product NRFEIS-730 will be introduced and giving a demonstration. It is capable of high speed capacitance measurement for Touch Panel Sensor by parallel testing on multiple channels without driver IC. Open/LEAK test measurement is also available. The newly-developed model enables testing in High throughput / High reliability / High maintainability.
We will offer the best solution at your request. Looking forward to work with you soon.

Product Lineup

- Open / Leak / Capacitance touch panel tester “NRFEIS-730” (Demonstration)

Information

Period From November 24th (Thu) to 26th (Sat)
Venue Shenzhen Convention & Exhibition Center
Booth 1C-229
Official site http://sz.quanchu.com.cn/en/index.htm

TPCA Show 2016

We are pleased to inform you that we will be exhibiting in TPCA Show held from 26 (Wed) – 28 (Fri), October 2016 at Taipei. For this occasion, we will demonstrate 2D/3D substrate inspection by optical inspection system “RSH-M120C” and introduce high speed, accurate embedded tester “R-5901i”. We would like to offer variety of products for electrical and optical testing and other new product such as peeling/detach automation system for MSAP. Looking forward to see you at site.

Product Lineup

- 2D/3D substrate inspection system “RSH-M120C” (Demonstration)
- Multi-faced FPC O/S inspection system “NRFEIS-3045/5060”
- Semiconductor package test system “GATS-7755/7756”, “GATS-7540/8600”
- PCB Test System “STAR REC M6ⅡWide/SW”
- High speed, accurate embedded tester “R-5910i” (Demonstration)
- Fixture ”15um Probe Fixture” and ”MEMS Spring probe”
- Peeling/Detaching Automation Machine for MSAP “NRDF/NRCL/NRCR series”

Information

Period From October 26th (Wed) to 28th (Fri)
Venue Taipei Nangang Exhibition Center
Booth I1114
Official site http://www.tpcashow.com/en/

Information Security EXPO

We are pleased to inform you that we will be exhibiting in Information Security EXPO held from 26 (Wed) – 28 (Fri) October 2016 at Makuhari Messe. For this occasion, we would like to introduce our Biometrics/Access control Iris recognition module. Our module for housing enables you to lock and unlock the door with no-key, empty hand. There is another series for access control especially suited for manufacturing line at factory and so on. We are more than happy to provide adequate equipment and looking forward to work with you soon.

Product Lineup

Iris recognition module
- for housing doors
- for user access control for manufacturing line
- for immigration inspection (Product from Iristech)

Information

Period From October 26th (Wed) to 28th (Fri)
Venue Makuhari Messe
Booth 11-36
Official site http://www.japan-it.jp/en/aki/

JPCA Show 2016

We are pleased to inform you that we will be exhibiting JPCA Show held from June 1 (Wed)- 3 (Fri), 2016 at Tokyo Big Site. For this occasion, we will give on-site demonstrations of FPC inspection system which is improved in speed and accuracy and newly developed high speed capacitance tester as well. Furthermore, variety of products will be prepare to be shown which includes the new product Peeling/Detaching Automation Machine for MSAP. We will offer the finest inspection and/or measurement technology which can fit the bill individually adaptable. Please visit our booth. We are looking forward to work with you soon.

Product Lineup

- Multi-faced FPC O/S inspection system “NRFEIS-3045X”
- High speed capacitance tester “R-730”
- Peeling/Detaching Automation Machine for MSAP “NRDF/NRCL/NRCR series”
- Optical Inspection System “RSH-S230T” “Rwi-300”
- SiP test system “GATS-7755/R-5910is”
- PCB Test System “STAR REC M6ⅡWide/SW”
- Fixture ”25um Probe Fixture”
- Data logger for automotive “TRENDCORDER”

Information

Period From June 1st (Wed) to 3rd (Fri)
Venue Tokyo Big Sight
Booth 5D-16
Official site http://www.jpcashow.com/show2016/en/

Automotive Engineering Exposition 2016

We are pleased to inform that NIDEC-READ will be exhibiting at Automotive Engineering Exposition, held in Pacifico Yokohama Exhibition Hall, on 26th -26nd May 2016. For this time, we will newly introduce variety of data loggers by DEWETRON GmbH. "All-in-One" models include a built-in display and multi-touch touch panel models will be showed up. Furthermore, speeding-up and more compact new data logger, TRIONet is ready to be introduced. Please visit and talk to us freely about your testing requirements. We are looking forward to see you.

Product Lineup

-Data Logger product by DEWETRON
 - DEWE2 A4
 - TRENDCORDER
 - TRIONet(NEW)
 - CVT Logger, etc.

Information

Period From May 26 th (Wed) to 28th (Fri)
Venue Pacifico Yokohama Exhibition Hall
Booth No.59
Official site http://expo.jsae.or.jp/english/

Semicon Southeast Asia 2016

We are pleased to inform that we will be participating at Semicon Southeast Asia 2016, held in Penang, 26th-28th April 2016. On this occasion, Nidec-Read will suggest world’s finest diameter, “MEMS spring probe” applicable for probe test required 60μm bump pitch and its “manufacturing process line”. If you are looking for AOI equipment, we are glad to provide our best test solution for you. Our flagship model, “RWi-series” which is available for 2D/3D & High-Speed Scanning is also introduced.
We are looking forward to see you.

Product Lineup

- Optical wafer bump inspection system “RWi-300”
- MEMS spring probe/ process line, etc.

Information

Period From April 26 (Tue) to 28 (Thu), 2016
Venue SPICE Arena
Booth B122
Official site http://www.semiconsea.org/

KPCA Show 2016

We are pleased to inform that we will be participating at KPCA Show, held in Seoul, 26th-28th April 2016. On this occasion, we are going to give demonstration of new products, NRFEIS-3045A, which is applicable for Flexible Printed Circuit testing. Additionally, high accuracy fixtures and high-speed capacitance tester R-730 will be introduced in the show. We are looking forward to see you soon.

Product Lineup

・ Flexible Printed Circuit Testing System NRFEIS-3045A series
・ High spec fixtures
・ High-speed capacitance tester R-730 etc.

Information

Period From April 26th (Tue) to 8th (Thu), 2016
Venue KINTEX
Booth E~F 115
Official site http://www.kpcashow.com/eng/main.asp

26th FINETECH JAPAN (International Touch Panel Technology Expo)

We are pleased to inform that we will be participating at FINETECH JAPAN (International Touch Panel Technology Expo), held in Tokyo, 6th-8th April 2016. On this occasion, we are going to introduce new products like NRFEIS-series applicable for Flexible Printed Circuit testing, Peeler & Detach Machine for HDI manufacturing, and high-speed and precision tester R-730.
Please feel free to contact us if you need any solution for touch-panel and FPC testing.

Product Lineup

・ Flexible Printed Circuit testing system NRFEIS series
・ For HDI substrate manufacturing Peeling/De-touch automation system
・ High-speed/Precision tester, etc.

Information

Period From April 6th(Wed) to 8th (Fri), 2016
Venue Tokyo Big Sight West Hall
Booth E48-30
Official site http://www.tpjapan.jp/en/Home/

CPCA Show 2016

We are pleased to inform that we will be participating at CPCA show 2016, held in Shanghai, 15th-17th March 2016. On this occasion, we will give a demonstration of high-speed HDI substrate testing machine and introduce flexible printed circuit board inspection system and achieved products which meets customer demand. Besides, newly released peeling and detach system and high-end fixture will be exhibited at the site as well. We are looking forward to see you.

Product Lineup

- Printed circuit board inspection system “STAR REC M6 Series”
- Flexible printed circuit board inspection system “NRFEIS Series”
- Peeling and detach system for HDI manufacturing
- Variety of high-end fixture etc.

Information

Period From March 15 (Tue) to 17 (Thu), 2016
Venue Shanghai New International Expo Center
Booth 6D68
Official site http://www.cpcashow.com/en/index.asp

8th Int'l Automotive Electronics Technology Expo

We are pleased to inform that we will be participating at 8th Int'l Automotive Electronics Technology Expo, held in Tokyo, 13th-15th January 2016. On this occasion, we will introduce you a variety of automotive testing devices such as “TRENDCODER”, “CVT logger” from DEWETRON GbmH, and “TRL non-contact wire harness tester”. Additionally, newly developed product, “Iris recognition module” which is applicable for automobile and other test solutions are ready to introduce. We are looking forward to see you.

Product Lineup

- Variety of measurement systems by DEWETRON “DEWE2A4”, “TRENDCODER”, “CVT Logger”
- For Wire harness test “TRL Non-contact tester”
- “Iris recognition module” for automotive
- Variety of products from Nidec group and partners.

Information

Period From January 13 (Wed) to 15 (Fri), 2016
Venue Tokyo Big Sight West Hall
Booth W1-35
Official site http://www.car-ele.jp/en/Home/

Semicon Japan 2015

We are pleased to inform that we will be participating at Semicon Japan 2015, held in Tokyo, 16th-18th December 2015. On this occasion, NIDEC-READ will suggest world’s finest diameter, “MEMS spring probe” applicable for probe test required 60μm bump pitch and its “manufacturing process line”. If you are looking for AOI equipment, we are glad to provide our best test solution for you. Our flagship model, “RWi-series” which is available for 2D/3D & High-Speed Scanning is also introduced. Additionally, our newly introduced “IoT solution” will be appeared at the site. We are looking forward to see you.

Product Lineup

- Optical wafer bump inspection system “RWi-300”
- MEMS spring probe/ process line
- IoT solution “IDEAS”

Information

Period From December 16 (Wed) to 18 (Fri), 2015
Venue Tokyo Big Sight
Booth 1708
Official site http://www.semiconjapan.org/en/exhibits

TPCA Show 2015

We are pleased to inform that we will be participating at TPCA show 2015, held in Taipei, 21st-23rd October 2015. On this occasion, we are exhibiting “NRFEIS-5060” which gives a demonstration, flexible printed circuit board inspection system, new model of semiconductor package inspection system for FC-CSP and optical vision inspection system etc. in order to fit a wide range of our customer’s bill. Besides, high accuracy tester “R-5810is” and IoT solution will be appeared at the site. We are looking forward to see you.

Product Lineup

- Flexible printed circuit board inspection system “NRFEIS-5060”
- Semiconductor package inspection system “GATS-7755” - Printed circuit board inspection system “STAR REC M6ⅡSW”
- Optical vision inspection system “RSH-S120/RWi-300”
- High accuracy tester “R-5810is” - New architecture fixture “Φ15um BB Probe fixture”
- IoT solution (corresponding to Internet of Things) etc.

Information

Period From October 21 (Wed) to 23 (Fri), 2015
Venue Taipei Nangang Exhibition Center
Booth J329
Official site http://www.tpcashow.com/en

JPCA Show 2015

We are pleased to inform that NIDEC-READ will be exhibiting at JPCA Show 2015, held in Tokyo Big sight, on 3rd-5th June 2015. This year, we will exhibit Semiconductor package open/leak inspection system "GATS-6310" and flexible printed circuit open/leak inspection system "NRFEIS-3045A". Not only test systems for PCBs and semiconductor packages but we also would like to introduce our optical inspection systems and automotive test systems. Improved model tester and high precision fixture will be put on the show as well. We believe that we are able to suggest an optimal methodology for each one of you by means of a wide range of our technology. We are looking forward to see you.

Product Lineup

- Semiconductor package open/leak inspection system "GATS-6310"
- Printed circuit board open/leak inspection system "STAR REC M6II Wide/SW"
- Open/leak tester "R-6510is"
- Optical Vision Inspection System "RSH-S230T", "RWi-300"
- High accuracy fixture, Coaxial MEMS probe, 15μm probe fixture, Universal fixture
- Flexible printed circuit open/leak inspection system "NRFEIS-3045A"
- Data logger correspond with automotive data logging "Trend Coder"

Information

Period From June 3 (Wed) to 5 (Fri) , 2015
Venue Tokyo Big Sight
Booth 5C-04
Official site http://www.jpcashow.com/show2015/en/

Automotive Engineering Exposition 2015

We are pleased to inform that NIDEC-READ will be exhibiting at Automotive Engineering Exposition, held in Pacifico Yokohama Exhibition Hall, on 20th -22nd May 2015. For this time, we will newly introduce variety of data loggers by DEWETRON GmbH. "All-in-One" models include a built-in display and multi-touch touch panel models will be showed up. Please visit and talk to us freely about your testing requirements. We are looking forward to see you.

Product Lineup

- Data Logger product by DEWETRON
"DEWE2-A4", "Trend Coder", "DEWE2-M4"

Information

Period From May 20 (Wed) to 22 (Fri), 2015
Venue Pasifico Yokohama Exhibition Hall
Booth No. 34
Official site http://expo.jsae.or.jp/english/

FINE TECH JAPAN (International Touch Panel Technology Expo)

We are pleased to inform that NIDEC-READ will be exhibiting at FINTETECH Japan, held in Tokyo Big Sight, 8th -10th April 2015. During the show, our new FPC testing solution, ”NRFEIS-Series” is newly introduced and demonstrated. Also, we will offer you our abundant experience and technology in the field of TSP testing. Please visit and talk to us freely about your testing requirements. We are looking forward to see you.

Product Lineup

- Flexible printed circuit inspection system "NRFEIS-3045A" (Demonstration)
- Touch screen panel inspection system "NRTES-Series"

Information

Period From April 8 (Wed) to 10 (Fri) , 2015
Venue Tokyo Big Sight
Booth East 6, 49-39
Official site http://www.tpjapan.jp/en/Home/

CPCA Show 2015

We are pleased to inform that we will be exhibiting at CPCA show 2015, held in Shanghai, 17th -19th March 2015. The exhibiting products is GATS-6310; for fine-pitched & Ultra Thin FC-CSP substrate testing and variety of testing fixtures. Product demonstration will be held during the show as well. We are looking forward to see you.

Product Lineup

- Semiconductor package inspection system "GATS-6310" (Demonstration)
- Touch screen panel inspection system "NRFEIS-Series"
- Fixture "Universal Fixture", "Coaxial fixture", "15μm probe fixture"

Information

Period From March 17 (Tue) to 19 (Thu), 2015
Venue Shanghai New International Expo Center
Booth 7F78
Official site http://www.cpcashow.com/en/index.asp

7th Int'l Automotive Electronics Technology Expo

It is our great pleasure to inform that we are joining at 7th Int’l Automotive Electronics Technology Expo, held in Tokyo Big Sight, 14th-16th January 2015. NIDEC-READ is planning to introduce “TRL non-contact wire harness tester” and “Data logger by DEWETRON”. More than that, co-development product, “Embedded camera module” and variety of test solutions for automotive components will be introduced on-site. Product demonstration will be prepared as well so that consider using the opportunity to find out excellent solutions for you. We are looking forward to see you.

Product Lineup

- TRL non-contact wire harness tester
- All-in-one portable data logger

Information

Period From January 14 (Wed) to 16 (Fri), 2015
Venue Tokyo Big Sight
Booth West 4-44
Official site http://www.car-ele.jp/en/Home/