Optical Vision
Inspection System

Wafer Bump Inspection System

RWi/TWi series is a 2D/3D optical inspection system which measures varous types of bump formed on semiconductor wafer.

RWi Series

RWi Series

RWi series is a 2D/3D optical inspection system which measures varous types of bump formed on semiconductor wafer.

TWi Series

TWi Series

TWi series is a 2D/3D optical inspection system which measures gold bump formed on semiconductor wafer.