MEMS Spring Probe

MEMS Spring Probe is developed by NIDEC-READ original ultra-fine 3D processing technology and enables our customer to supply advanced and innovative test solutions at PCB & semiconductor testing market.

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Spring Probe for LSI Test

The product is particularly efficient for testing semiconductor wafer such as application processor and microprocessor.

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Micro Tube

Micro tube is developed by way of electroforming technology. It supports testing the state-of-art technology such as semiconductor and biotechnology market.