MEMS Spring Probe
MEMS Spring Probe is developed by NIDEC-READ original ultra-fine 3D processing technology and enables our customer to supply advanced and innovative test solutions at PCB & semiconductor testing market.
Spring Probe for LSI Test
The product is particularly efficient for testing semiconductor wafer such as application processor and microprocessor.
Micro tube is developed by way of electroforming technology. It supports testing the state-of-art technology such as semiconductor and biotechnology market.