We are pleased to inform that we will be participating at FINETECH JAPAN, held in Tokyo, 5 th-7th April.
On this occasion, we will give a demonstration of OPEN/μShort/LEAK test systems both NRFEIS-3045X and NRFEIS-730. Besides of that, we will introduce our wide variety of test solutions for you. We are looking forward to see you at our booth.
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