We are pleased to inform that we will be participating at 10th Int‘l Automotive Electronics Technology Expo, held in Tokyo, 17th-19th January 2018. On this occasion, we would like to introduce our automotive testing & measurement systems such as 「DEWE2-A4」, 「TRIONet」 products by DEWETRON and probe cards and MEMS spring probes for semiconductor testing especially for automotive devices.

Click here more information.