Semiconductor Package Inspection System

NIDEC-READ GATS (Grid Array Testing System) series carry out open/leak circuit tests on semiconductor package (MCM/CSP/BGA) and is available for a wide spectrum of middle to large-sized circuit substrates.

GATS-2128

GATS-2128

GATS-2128 is an open/leak test system for high density interconnect inspection such as FC-BGA and MCM.

GATS-6310

GATS-6310

GATS-6310 is a next generation inspection system, which is suitable for fine-pitched, ultrathin FP-CSP, fulilling both high speed and high accuracy requirements.